- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
Patent holdings for IPC class G01N 23/20
Total number of patents in this class: 1157
10-year publication summary
|
124
|
111
|
106
|
119
|
88
|
57
|
56
|
68
|
41
|
16
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 379 |
50 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
21 |
| Bruker AXS, Inc. | 42 |
21 |
| Koninklijke Philips N.V. | 22975 |
19 |
| Shimadzu Corporation | 5791 |
16 |
| Konica Minolta, Inc. | 8349 |
13 |
| Rapiscan Systems, Inc. | 300 |
13 |
| Bruker Technologies Ltd. | 100 |
13 |
| Morpho Detection, LLC | 111 |
12 |
| Centre National de La Recherche Scientifique | 9632 |
11 |
| Bruker AXS GmbH | 49 |
11 |
| KLA-Tencor Corporation | 2574 |
11 |
| Saudi Arabian Oil Company | 11322 |
11 |
| Sigray, Inc. | 68 |
11 |
| Malvern PANalytical B.V. | 124 |
11 |
| Halliburton Energy Services, Inc. | 20165 |
10 |
| LG Chem, Ltd. | 17205 |
10 |
| Canon Inc. | 36841 |
10 |
| Paul Scherrer Institut | 299 |
10 |
| Koninklijke Philips Electronics N.V. | 13133 |
9 |
| Other owners | 864 |